Quick Methods for Reliable Component Testing

Written by Dennis Weller, Agilent Technologies

When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the value of one that is unmarked. The general idea behind this testing is to apply a stimulus to the component using a waveform generator and measure the response using an oscilloscope. Specialized component testers would be the optimum course of action, but sometimes such testers may not be readily available.

That’s when you need a quick way to test components with the more commonly available scope and a stand-alone waveform generator. Another option would be a one-box solution for component testing, such as the Agilent Technologies InfiniiVision X-Series Oscilloscope with a built-in waveform generator.

Figure 1. Test Configuration

Figure 1 illustrates the measurement configuration. The waveform generator is connected to the oscilloscope input with a tee off to the component, also referred to as the DUT. For testing surface-mount components, the Agilent Technologies 11060A Surface-Mount Device Probe or equivalent is recommended. The waveform generator voltage (Vsrc) is applied to the DUT through the generator’s 50-Ω source resistance.

The voltage across the DUT is measured by the oscilloscope input channel. The oscilloscope is triggered from the waveform generator. In the case of Agilent’s X-Series Oscilloscope, this trigger connection is built in, eliminating the need for an additional cable connection and trigger configuration steps. You select the built-in waveform generator as the trigger source.


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